Abstract & Overview
In the present study, ZnO thin films were deposited by chemical bath deposition technique on a seeded substrate at pH-5.0 with equimolar concentration of HMTA and Zinc Nitrate, for different deposition periods. Structural, morphological and elemental analysis of as deposited thin films was done by using the characterization tools like X-ray diffraction, Scanning electron microscopy (SEM) and Energy Dispersive X-Ray Spectroscopy (EDX). Sheet resistance was calculated using four probe method. The study lay a foundation stone for understanding the use of ZnO thin films for further electronic application by correlating the growth period at a selected pH and concentration with the various morphological characteristics of nanocrystalline thin ZnO films.