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Home/e-Resources/Electrical Engineering/Testing of Cylindrical Surrounding Double-Gate MOSFET Parameters Using Image Acquisition
PeriodicalsElectrical Engineering

Testing of Cylindrical Surrounding Double-Gate MOSFET Parameters Using Image Acquisition

Viranjay Mohan Srivastava·Ghanshyam Kumar Singh
Journal of signal processing theory and applications2013

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Viranjay Mohan Srivastava, Ghanshyam Kumar Singh (2013). Testing of Cylindrical Surrounding Double-Gate MOSFET Parameters Using Image Acquisition. Journal of signal processing theory and applications. https://doi.org/10.7726/jspta.2013.1003

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Srivastava, V. M., & Singh, G. K. (2013). Testing of Cylindrical Surrounding Double-Gate MOSFET Parameters Using Image Acquisition. Journal of signal processing theory and applications. https://doi.org/10.7726/jspta.2013.1003
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