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PeriodicalsElectronics & Telecommunication Engineering

TLP calibration, correlation, standards, and new techniques

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Abstract & Overview

This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the I-V curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate dV/dt effects and HBM/TLP correlation and miscorrelation. Finally, a calibration method and standard TLP test method are presented for adaptation by the industry. This is necessary to provide correlation and repeatability of experimental data.

Cite this record

Jon Barth, Koen G. Verhaege, Leo G. Henry, John Richner (2001). TLP calibration, correlation, standards, and new techniques. IEEE Transactions on Electronics Packaging Manufacturing, 24(2), 99–108. https://doi.org/10.1109/6104.930960

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Barth, J., Verhaege, K. G., Henry, L. G., & Richner, J. (2001). TLP calibration, correlation, standards, and new techniques. IEEE Transactions on Electronics Packaging Manufacturing, 24(2), 99–108. https://doi.org/10.1109/6104.930960
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